Abstract Volume:5 Issue-8 Year-2017 Original Research Articles
|Online ISSN : 2347 - 3215
Issues : 12 per year
Publisher : Excellent Publishers
Email : firstname.lastname@example.org
In this study, the electrical properties of various silicon specimens with different conductivity types and different carrier concentration were characterized, using In-Line Four Probe (ILFP) technique and Resistivity Frequency variation technique (LCR technique) as well. The effect of the frequency on the electrical properties of these samples was also investigated. The results of the study demonstrate some conclusions and recommendations for improving the performance of silicon based solar cells as well as for further development in the field of Si technology.
How to cite this article:Dana Abdul Aziz Al shammari. 2017. The Effect of Frequency of Electromagnetic Waves on Basic Electrical Elements in the Si of LCR TechniqueInt.J.Curr.Res.Aca.Rev. 5(8): 1-11