Abstract Volume:5 Issue-8 Year-2017 Original Research Articles
Online ISSN : 2347 - 3215 Issues : 12 per year Publisher : Excellent Publishers Email : editorijcret@gmail.com |
The Effect of Frequency of Electromagnetic Waves on Basic Electrical Elements in the Si of LCR Technique
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Abstract:
In this study, the electrical properties of various silicon specimens with different conductivity types and different carrier concentration were characterized, using In-Line Four Probe (ILFP) technique and Resistivity Frequency variation technique (LCR technique) as well. The effect of the frequency on the electrical properties of these samples was also investigated. The results of the study demonstrate some conclusions and recommendations for improving the performance of silicon based solar cells as well as for further development in the field of Si technology.
Keywords: In-Line Four Probe ILFP, EM waves Gravel, Bulk resistivity, Solar cells
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How to cite this article:
Dana Abdul Aziz Al shammari. 2017. The Effect of Frequency of Electromagnetic Waves on Basic Electrical Elements in the Si of LCR TechniqueInt.J.Curr.Res.Aca.Rev. 5(8): 1-11doi: https://doi.org/10.20546/ijcrar.2017.508.001
Copyright: This is an Open Access article distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike license.
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